Digital forward error correction in optoelectronic image analysis: a case study

Sven Krueger; Stephan Teiwes; Hartmut Gruber; Mathias Senoner; Guenther K.G. Wernicke

doi:10.1117/12.341312

9 March 1999 Digital forward error correction in optoelectronic image analysis: a case study

Sven Krueger, Stephan Teiwes, Hartmut Gruber, Mathias Senoner, Guenther K.G. Wernicke

Proceedings Volume 3715, Optical Pattern Recognition X; (1999) https://doi.org/10.1117/12.341312
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

The general advantages of optical filtering methods for real- time image analysis have been extensively discussed in literature. Regarding the applicability of optical filtering for industrial purposes it is important that optical and opto- electronic off-the-shelf components can be used for the production of opto-electronic image processing hardware. However, practical experiences show that such components often do not realize theoretically designed filtering systems in an acceptable manner. Instead, due to their potential imperfection, they can be a source of noise effects and artifacts in filtered images. In optical inspection applications such artefacts can cause false alarms which cannot be tolerated. In this paper we focus on an opto- electronic image analysis system which has been composed using off-the-shelf opto-electronic components. We discuss the setup and its elements. The disturbing effects introduced by these components on the filtered images are demonstrated in a specific application example. Exploiting the fact that the noise effects of the optical components can be recorded, we implemented a digital forward-error-correction that reduces noise in the filtered images drastically. This method is very simple, fast, and efficient. Therefore, it is very useful in the development of opto-electronic image processing hardware for industrial purposes.

Citation Download Citation

Sven Krueger, Stephan Teiwes, Hartmut Gruber, Mathias Senoner, and Guenther K.G. Wernicke "Digital forward error correction in optoelectronic image analysis: a case study", Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); https://doi.org/10.1117/12.341312

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