Photoreflectance investigations of AlxGa1-xAs/GaAs bandgap dependence on Al content

Piotr Sitarek; Jan Misiewicz; Erling Veje

doi:10.1117/12.344735

8 April 1999 Photoreflectance investigations of Al_xGa_1-xAs/GaAs bandgap dependence on Al content

Piotr Sitarek, Jan Misiewicz, Erling Veje

Proceedings Volume 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology; (1999) https://doi.org/10.1117/12.344735
Event: International Conference on Solid State Crystals '98, 1998, Zakopane, Poland

Abstract

The room temperature photoreflectance spectroscopy (PR) was used to investigate Al_xGa_1-xAs/GaAs structures. All structures were grown by molecular beam epitaxy technique. The aluminum content changes from x equals 0.11 to x equals 0.53. The alloy composition was determined from X-ray diffraction measurements. The dependence of the direct band gap energy on the Al content was under investigations. To obtain the direct band gap energy, the measured PR spectra were analyzed using Aspnes lineshape procedure. The determined E_g^(AlGaAs) dependence on x for doped Al_1-xGa_xAs layers was compared to previous results.

Citation Download Citation

Piotr Sitarek, Jan Misiewicz, and Erling Veje "Photoreflectance investigations of Al_xGa_1-xAs/GaAs bandgap dependence on Al content", Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); https://doi.org/10.1117/12.344735

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