Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells

Bronislaw Susla; Eugeniusz Chimczak; Miroslawa Bertrandt-Zytkowiak; Maciej Kaminski

doi:10.1117/12.344741

8 April 1999 Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells

Bronislaw Susla, Eugeniusz Chimczak, Miroslawa Bertrandt-Zytkowiak, Maciej Kaminski

Proceedings Volume 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology; (1999) https://doi.org/10.1117/12.344741
Event: International Conference on Solid State Crystals '98, 1998, Zakopane, Poland

Abstract

A point contact ZnS:Mn,Cu thin film-normal metal (Pt_0.9Ir_0.1 junctions were investigated. The current and differential resistance versus dc applied voltage were measured. We observed, the dependencies exhibit memory effect. It was found that the effect strongly depends on temperature. It is shown that Pool-Frenkel mechanism of the charge transport describes well the measured I(U) characteristics.

Citation Download Citation

Bronislaw Susla, Eugeniusz Chimczak, Miroslawa Bertrandt-Zytkowiak, and Maciej Kaminski "Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells", Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); https://doi.org/10.1117/12.344741

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available