BATC multipurpose wavefront error sensing assembly

Timothy C. Towell; Paul D. Atcheson

doi:10.1117/12.367616

29 October 1999 BATC multipurpose wavefront error sensing assembly

Timothy C. Towell, Paul D. Atcheson

Proceedings Volume 3785, Advanced Telescope Design, Fabrication, and Control; (1999) https://doi.org/10.1117/12.367616
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Active and adaptive imaging systems rely on accurate measurement, correction, and maintenance of the wavefront error in a collected signal. The performance of different sensing techniques will depend on the characteristics of the input optical signal, including such parameters as spatial and temporal disturbance bandwidths, absolute wavefront error, source spectral and radiometric content, and image sampling parameters. To determine the relative performance of error sensing techniques, it is useful to conduct the error sensing on identical inputs. This leads to the desire to have multiple simultaneous sensing capabilities within a given architecture. The BATC Wavefront Control Testbed error sensing assembly provides several types of wavefront sensing within a single sensor subassembly, allowing different techniques to be evaluated operating on the same input. Currently, the configuration provides the capability to sense wavefront errors through shearing interferometry, direct image position and intensity measurement, edge sampling, and Hartmann-based mask operations. This paper discusses the imaging and sensing capabilities of the assembly, describes the types of sensing that have been currently evaluated in sensing and correction experiments, and defines the parameters for extending the capability to include other types of sensing.

Citation Download Citation

Timothy C. Towell and Paul D. Atcheson "BATC multipurpose wavefront error sensing assembly", Proc. SPIE 3785, Advanced Telescope Design, Fabrication, and Control, (29 October 1999); https://doi.org/10.1117/12.367616

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available