Paper
22 September 1999 Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy
Author Affiliations +
Abstract
We have developed a NSOM which has a metallic probe tip and a highly focused evanescent light field spot. Evanescent illumination effectively rejects the background light, e.g. the stray light from the shaft of the probe. By suppressing the stray light and utilizing the field enhancement generated by the metallic probe, a sudden increment of the fluorescence was observed in the near-field region. We have used this for near-field Raman scattering detection of molecules vibrations with the aid of surface enhanced Raman scattering. One specific stokes-Raman-shifted lines was observed by near-field excitation together with several other lines that were excited by the far-field light.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasushi Inouye, Norihiko Hayazawa, Koji Hayashi, Zouheir Sekkat, and Satoshi Kawata "Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy", Proc. SPIE 3791, Near-Field Optics: Physics, Devices, and Information Processing, (22 September 1999); https://doi.org/10.1117/12.363860
Lens.org Logo
CITATIONS
Cited by 68 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field scanning optical microscopy

Luminescence

Raman scattering

Near field

Light scattering

Stray light

Photons

Back to Top