Paper
12 November 1999 Optical properties of InGaN grown by MOCVD on sapphire and on bulk GaN
Author Affiliations +
Proceedings Volume 3896, Design, Fabrication, and Characterization of Photonic Devices; (1999) https://doi.org/10.1117/12.370346
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
Experimental data on photoluminescence of various bulk and quantum-well epitaxial InGaN/GaN structures grown by MOCVD are interpreted in terms of a band-tail model of inhomogeneously broadened radiative recombination. The anomalous temperature-induced blue spectral is shown to result from band-tail recombination under non-degenerate conditions. Significant differences are observed between epilayers grown on sapphire substrates and on GaN substrates prepared by the sublimination method, with no apparent evidence of band tails in homoepitaxial structures, indicating their higher crystalline quality.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marek Osinski, Petr Georgievich Eliseev, Jinhyun Lee, Vladimir A. Smagley, Tamoya Sugahara, and Shiro Sakai "Optical properties of InGaN grown by MOCVD on sapphire and on bulk GaN", Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); https://doi.org/10.1117/12.370346
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Indium gallium nitride

Gallium nitride

Quantum wells

Sapphire

Electroluminescence

Luminescence

Indium

Back to Top