Paper
19 October 1999 Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems
Alexandre I. Baklanov, Alexander S. Zabiyakin, Maxim V. Klushnikov
Author Affiliations +
Proceedings Volume 3901, Photonics for Transportation; (1999) https://doi.org/10.1117/12.365929
Event: Photonics for Transportation, 1999, Prague, Czech Republic
Abstract
Instrumentation for high-precision in-flight focusing of on- board optoelectronic equipment is described. The first part of the paper gives an overview of the existing focusing techniques and describes their application for particular remote sensing task solutions. A comparison of different methods is made, the accuracy provided by each method is assessed and one of the best techniques--a contrast method-- is considered. This method is shown to provide high precision--5 micrometers or better. The second part describes a mathematical model of instrumentation using this method. It includes a diffraction modulation transfer function (MTF), an MTF related to optical system aberrations and an optical system defocusing MTF. The simulation results are shown and respective recommendations are given.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandre I. Baklanov, Alexander S. Zabiyakin, and Maxim V. Klushnikov "Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems", Proc. SPIE 3901, Photonics for Transportation, (19 October 1999); https://doi.org/10.1117/12.365929
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Bismuth

Image processing

Modulation transfer functions

Optoelectronics

Point spread functions

Remote sensing

Back to Top