Neural network based automated texture classification system

Harry Coomar Shumsher Rughooputh; Soonil D. D. V. Rughooputh; Jason M. Kinser

doi:10.1117/12.380089

21 March 2000 Neural network based automated texture classification system

Harry Coomar Shumsher Rughooputh, Soonil D. D. V. Rughooputh, Jason M. Kinser

Proceedings Volume 3966, Machine Vision Applications in Industrial Inspection VIII; (2000) https://doi.org/10.1117/12.380089
Event: Electronic Imaging, 2000, San Jose, CA, United States

Abstract

Texture analysis is an important generic research area of machine vision for detection of patterns in two-dimensional data representations. Despite the wide array of potential areas of application for texture analysis, only a limited number of successful exploitations of texture exist so far since most reported techniques lack the computational tractability required in industry. Neutral network based classifiers have also been proposed for texture recognition. Recent studies of the visual cortex of the cat highlight the role of temporal processing using synchronous oscillations for object identification. In this paper, the original Eckhorn's neural model is modified according to Johnson for texture classification and analysis. A two-dimensional texture image can be mapped into a one-dimensional output function time signature. Each time signature in the form of 8-bit gray level images are further presented to a second PCNN to produce binary barcodes. There is a one-to-one correspondence between these barcoded PCNN outputs and the corresponding input images. The effectiveness of this novel method is demonstrated using 50 textures taken from Brodatz texture album. An n-tuple (RAM-based) neural network is finally used for recognition. Our test results demonstrate that the approach is fast and robust making it suitable for real-time applications.

Citation Download Citation

Harry Coomar Shumsher Rughooputh, Soonil D. D. V. Rughooputh, and Jason M. Kinser "Neural network based automated texture classification system", Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); https://doi.org/10.1117/12.380089

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available