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A new method of self-calibration of the emissive power of an emissive diode is presented here. The method involves a determination of the overall quantity of the thermal and emissive power released in a semiconductor-type radiating structure in the non-steady-state mode. According to a preliminary analysis it is characterized by satisfactory metrological characteristics.
L. S. Lovinsky
"Reproduction of emissive power (self-calibration) using an emissive diode", Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); https://doi.org/10.1117/12.373725
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L. S. Lovinsky, "Reproduction of emissive power (self-calibration) using an emissive diode," Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); https://doi.org/10.1117/12.373725