Paper
19 October 2000 Multiwavelength monitoring of thin film growth using a fiber spectrometer
Wayne G. Sainty, David W. Sainty
Author Affiliations +
Abstract
We report here on a novel optical thin film monitoring technique. The instrument has been developed to improve the spectral performance of multilayer stacks by monitoring the instantaneous spectral performance over a wide wavelength band. Use is made of two commercially available miniature fibre spectrometers to cover the band 200 nm to 1 μm. A special software program has been written to read in the data from dual spectrometers and display the data to the monitor. For each layer, the real time data is compared to a calculated spectral performance to assist with the correct film thickness termination. The system stability is assisted by continuous referencing of the lamp emission spectrum. Very complex multilayers can be reliably deposited using the technique.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wayne G. Sainty and David W. Sainty "Multiwavelength monitoring of thin film growth using a fiber spectrometer", Proc. SPIE 4094, Optical and Infrared Thin Films, (19 October 2000); https://doi.org/10.1117/12.404756
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Multilayers

Lamps

Spectroscopy

Thin films

Coating

Human-machine interfaces

Optical filters

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