Paper
12 May 2000 Accurate spectral method for measuring twist angle of TN cells with rubbed and grooved surfaces
Victor A. Konovalov, Anatoli A. Muravski, Sergei Ye. Yakovenko, Josef Pelzl
Author Affiliations +
Proceedings Volume 4147, Liquid Crystals: Chemistry, Physics, and Applications; (2000) https://doi.org/10.1117/12.385699
Event: XIII International Conference on Liquid Crystals: Chemistry, Physics, and Applications, 1999, Krynica Zdroj, Poland
Abstract
Accurate optical method for measuring twist angle in TN LC cells is developed. Deviation of the measured values at different orientation of the cell and polarizes have been analyzed. The method allows to determine twist angle with high accuracy for cells with rubbed surfaces as well as for cells where at least one surface is grooved.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor A. Konovalov, Anatoli A. Muravski, Sergei Ye. Yakovenko, and Josef Pelzl "Accurate spectral method for measuring twist angle of TN cells with rubbed and grooved surfaces", Proc. SPIE 4147, Liquid Crystals: Chemistry, Physics, and Applications, (12 May 2000); https://doi.org/10.1117/12.385699
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Cited by 2 scholarly publications.
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KEYWORDS
Polarizers

Transmittance

Liquid crystals

LCDs

Atomic force microscopy

Crystals

Optical alignment

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