Optical Characterization Of The Lockheed Sensor Test Facility

Wayne Metheny; Tom Pope; Bruce Steakley

doi:10.1117/12.935914

22 September 1983 Optical Characterization Of The Lockheed Sensor Test Facility

Wayne Metheny, Tom Pope, Bruce Steakley

Proceedings Volume 0416, Applications of Optical Metrology: Techniques and Measurements II; (1983) https://doi.org/10.1117/12.935914
Event: 1983 Technical Symposium East, 1983, Arlington, United States

Abstract

The recent development of a new long-wave infrared (LWIR) sensor test facility^l presented a number of interesting problems during the course of the optical system alignment. This facility, the Lockheed Sensor Test Facility (STF), was designed primarily for calibration and system testing of LWIR sensors in the 5 to 30 pm range. It combines a low background vacuum chamber with a unique wide field-of-view optical system. This paper will discuss the facility and its optical instrumentation with emphasis on assembly, metrology of alignment, optical characterization, tasks complicated by manufacturing oversights, and an aluminum support structure which shrinks over 1 in. when it is cooled 250 K to the cold operating temperature.

Citation Download Citation

Wayne Metheny, Tom Pope, and Bruce Steakley "Optical Characterization Of The Lockheed Sensor Test Facility", Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); https://doi.org/10.1117/12.935914

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