Paper
29 June 2001 High-intensity laser processing of thin films
Vladislav V. Yakovlev, J. Magyar, C. Aita, A. Sklyarov, Katerina Mikhailichenko
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Abstract
We use high intensity nanosecond laser pulses of different wavelengths to modify thin film coatings (silica and titania) on the surface of silicon. We find that films as thick as 1 micron can be removed from the surface in one shot with minor or no damage to the Si surface. We also find the accumulated effect of multiple pulse irradiation. Finally we report our preliminary results on phase transformations in titania films induced by high intensity laser.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladislav V. Yakovlev, J. Magyar, C. Aita, A. Sklyarov, and Katerina Mikhailichenko "High-intensity laser processing of thin films", Proc. SPIE 4274, Laser Applications in Microelectronic and Optoelectronic Manufacturing VI, (29 June 2001); https://doi.org/10.1117/12.432520
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Silicon

Silicon films

Thin films

Raman spectroscopy

Scanning electron microscopy

Semiconductor lasers

Oxides

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