Paper
4 April 2001 Model-based algorithm for localization and measurement of miniature SMC objects
JennKwei Tyan, Ming Fang
Author Affiliations +
Proceedings Volume 4301, Machine Vision Applications in Industrial Inspection IX; (2001) https://doi.org/10.1117/12.420904
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
This paper presents a model-based algorithm for localization and measurement of SMC objects in miniature scale. The algorithm comprises a coarse-to-fine search strategy that fully utilizes all available information from object region and contour. In the coarse search stage, the moment transformations combined with an iterative segmentation scheme enables object localization performed in large search space and produces rough estimates of the pose parameters. Then, the canny edge detection and interpolation process is applied to obtain accurate object boundary as best as possible that allows an iterative optimization procedure to refine the initial estimates. The essential idea underlying our approach is by modeling the object with a polygonal shape and assumes that the input object is located on simple image background, which is suitable for a pick-and-place system used by semiconductor assembly. Finally, the result shows a compromise between accuracy and image resolution.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
JennKwei Tyan and Ming Fang "Model-based algorithm for localization and measurement of miniature SMC objects", Proc. SPIE 4301, Machine Vision Applications in Industrial Inspection IX, (4 April 2001); https://doi.org/10.1117/12.420904
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KEYWORDS
Image segmentation

Data modeling

Edge detection

Inspection

Image processing

Model-based design

Mathematical modeling

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