Paper
28 June 2001 CdZnTe detector as an x-ray spectrometer
Satoshi Miyajima, Hideaki Sakuragi, Masao Matsumoto
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Abstract
In this study, we evaluated a CdZnTe (CZT) detector as an x-ray spectrometer. The output of the semiconductor detector is basically distorted due to the processes of energy deposition, charge generation and pulse processing. In addition, the distortion due to the charge transport process must be taken into account when using a CZT detector. First, we calculated response functions of the CZT detector using the EGS4. In the code, the Hecht equation was utilized to deal with the trapping of charge carriers during charge transport. The parameters in the equation, mean free path of charge carriers, were determined to make the calculated response functions the same as the measured response to mono-energetic gamma-rays. Secondly, we corrected x-ray spectra using the calculated response functions. The stripping method was employed in the correction procedure. The results indicate that a CZT detector is useful in x-ray spectrometry with the proper corrections.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoshi Miyajima, Hideaki Sakuragi, and Masao Matsumoto "CdZnTe detector as an x-ray spectrometer", Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); https://doi.org/10.1117/12.430925
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Sensors

Distortion

X-ray detectors

Spectroscopy

Gamma radiation

Semiconductors

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