Paper
21 December 2001 Influence of aberrations on the image quality of subtle periodic structures in case of high entrance numerical apertures
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Abstract
The numerical modeling of influence of aberrations on pictur quality of thin periodic structures with taking into account a high entrance numerical aperture (NA) on the basis of the vector theory of diffraction is presented. The simulation algorithm and brief theoretical considerations are discussed. It is shown the influence of the entrance NA on image quality of microscope objectives is different for various values of NA and the contrast increases with the higher entrance NA.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander V. Belozubov "Influence of aberrations on the image quality of subtle periodic structures in case of high entrance numerical apertures", Proc. SPIE 4436, Wave-Optical Systems Engineering, (21 December 2001); https://doi.org/10.1117/12.451304
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KEYWORDS
Image quality

Diffraction

Objectives

Microscopes

Monochromatic aberrations

Computer simulations

Electromagnetic radiation

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