Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe

Yongho Seo; Wonho Jhe

doi:10.1117/12.449529

5 December 2001 Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe

Yongho Seo, Wonho Jhe

Proceedings Volume 4456, Controlling and Using Light in Nanometric Domains; (2001) https://doi.org/10.1117/12.449529
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We suggest two methods attaching tip to the quartz crystal resonator to be applied to a near-field optical scanning microscope probe. High-speed near-field scanning optical microscopy images obtained with the quartz crystal resonator probe are presented. We have achieved fast scanning imaging at the scanning speed of 1.3 mm/s without any compromise of spatial lateral resolution. Applying a concept of the acoustic wave, the topographic image of soft sample with the quartz crystal resonator probe is interpreted.

Citation Download Citation

Yongho Seo and Wonho Jhe "Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe", Proc. SPIE 4456, Controlling and Using Light in Nanometric Domains, (5 December 2001); https://doi.org/10.1117/12.449529

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