Improving the performance of the semiconductor panel used in millimeter and IR radar by shaping illuminating spot properties

Mohammad H. Rahnavard; Aref Bakhtazad; Mehrdad Zomorrodi

doi:10.1117/12.455109

8 February 2002 Improving the performance of the semiconductor panel used in millimeter and IR radar by shaping illuminating spot properties

Mohammad H. Rahnavard, Aref Bakhtazad, Mehrdad Zomorrodi

Author Affiliations +

Proceedings Volume 4486, Infrared Spaceborne Remote Sensing IX; (2002) https://doi.org/10.1117/12.455109
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

An optical processing technique is introduced. This technique can improve the resolution of any scanning imaging system, that extract information by using the electronic behavior of materials. In this optical processing technique proper transparency, and adjusting the scanning light intensity are used. This technique can improve the performance of digital image enhancer. We implement our idea on a familiar millimeter image converter.

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Mohammad H. Rahnavard, Aref Bakhtazad, and Mehrdad Zomorrodi "Improving the performance of the semiconductor panel used in millimeter and IR radar by shaping illuminating spot properties", Proc. SPIE 4486, Infrared Spaceborne Remote Sensing IX, (8 February 2002); https://doi.org/10.1117/12.455109

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