Charge diffusion and loss as a function of absorption depth in x-ray CCD

Makoto Kohno; Kensuke Imanishi; Aya Bamba; Masahiro Tsujimoto; Hiroshi Murakami; Takeshi G. Tsuru; Katsuji Koyama

doi:10.1117/12.454220

25 January 2002 Charge diffusion and loss as a function of absorption depth in x-ray CCD

Makoto Kohno, Kensuke Imanishi, Aya Bamba, Masahiro Tsujimoto, Hiroshi Murakami, Takeshi G. Tsuru, Katsuji Koyama

Proceedings Volume 4497, X-Ray and Gamma-Ray Instrumentation for Astronomy XII; (2002) https://doi.org/10.1117/12.454220
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We study the relation between diffusion and loss of charge produced in X-ray CCDs with the fitting method. We obtain the extent and the pulse height of each X-ray event in a CCD by a two-dimensional image-fitting the charge distribution of the event. For the monochromatic X-rays, we find that the event with small extent keeps all the charge produced, while that with larger extent than a certain value loses some part of the produced charge as a function of extent. The result suggests that the event with a small extent is produced by an X-ray absorbed in the depletion layer. On the other hand, the event with large extent corresponds to an X-ray absorbed in the field-free region. We develop two new methods which enable us to derive the relation between the extent of an event and the absorption depth. One is performed by illuminating well calibrated monochromatic X-ray source. The other is realized by using with two monochromatic X-rays and enables us to measure the thickness of the CCD depletion layer without calibrating absolute flux of the monochromatic X-rays.

Citation Download Citation

Makoto Kohno, Kensuke Imanishi, Aya Bamba, Masahiro Tsujimoto, Hiroshi Murakami, Takeshi G. Tsuru, and Katsuji Koyama "Charge diffusion and loss as a function of absorption depth in x-ray CCD", Proc. SPIE 4497, X-Ray and Gamma-Ray Instrumentation for Astronomy XII, (25 January 2002); https://doi.org/10.1117/12.454220

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available