Paper
14 November 2001 Low timing-jitter pulsed hard x-ray photography by laser-plasma-triggered electron beam
Takashi Iwamoto, Yuji Morihisa, Yuzo Nagumo, Shigeki Hayashi, Takashi Yagi, Kazumasa Honda, Isao Kojima
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Abstract
We have developed the stress-strain in-situ measurement system of rotating object with a low timing-jitter pulsed x- ray source triggered by a laser plasma and the triggering jitter of the pulsed x-ray was less than 2nsec. This technique was applied to measure the lattice constant variation of a rotating sample under the influence of stress caused by a centrifugal force.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takashi Iwamoto, Yuji Morihisa, Yuzo Nagumo, Shigeki Hayashi, Takashi Yagi, Kazumasa Honda, and Isao Kojima "Low timing-jitter pulsed hard x-ray photography by laser-plasma-triggered electron beam", Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); https://doi.org/10.1117/12.448467
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KEYWORDS
X-rays

Diffraction

X-ray diffraction

X-ray sources

X-ray optics

Fluctuations and noise

Aluminum

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