Tellurium antisites in CdZnTe

Muren Chu; Sevag Terterian; David Ting; Ralph B. James; Jay Chris Erickson; H. Walter Yao; Terrance Thiem Lam; Marek Szawlowski; Richard W. Szczebiot

doi:10.1117/12.450755

18 December 2001 Tellurium antisites in CdZnTe

Muren Chu, Sevag Terterian, David Ting, Ralph B. James, Jay Chris Erickson, H. Walter Yao, Terrance Thiem Lam, Marek Szawlowski, Richard W. Szczebiot

Author Affiliations +

Proceedings Volume 4507, Hard X-Ray and Gamma-Ray Detector Physics III; (2001) https://doi.org/10.1117/12.450755
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

The n-type conduction of CdTe and Cd_0.96Zn_0.04Te crystals grown from melts with excess tellurium indicates that the origin of the donors with an energy level at 0.01 eV below the conduction band are most likely singly ionized tellurium antisites instead of cadmium interstitials. Based on this model, the deep level at 0.75 eV below the conduction band is therefore doubly ionized tellurium antisites. After increasing the zinc content over 7%, CdZnTe turns to p-type. The conduction type variation of CdZnTe crystals as a function of zinc contents is explained by the compensation between the donors of Te-antisites and the acceptors of Cd vacancies. High resitivity Cd_0.9Zn_0.1Te crystals are produced by compensating the p-type crystals with indium at a low doping level of 1- 5x10¹⁵ cm^-3. At room temperature, the high yield CdZnTe radiation detectors can resolve the six low energy peaks from the Am²⁴¹ source, a performance comparable to the best reported CdZnTe detectors.

Citation Download Citation

Muren Chu, Sevag Terterian, David Ting, Ralph B. James, Jay Chris Erickson, H. Walter Yao, Terrance Thiem Lam, Marek Szawlowski, and Richard W. Szczebiot "Tellurium antisites in CdZnTe", Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); https://doi.org/10.1117/12.450755

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