Reliefographical structures based on doped chalcogenide semiconductors for optical data storage in wide spectral region including x-ray

Vasile K. Rotaru; Igor V. Ciapurin; Oleg Korshack

doi:10.1117/12.450785

19 December 2001 Reliefographical structures based on doped chalcogenide semiconductors for optical data storage in wide spectral region including x-ray

Vasile K. Rotaru, Igor V. Ciapurin, Oleg Korshack

Author Affiliations +

Proceedings Volume 4508, Penetrating Radiation Systems and Applications III; (2001) https://doi.org/10.1117/12.450785
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We report a non-silver, two-layered semiconductor-thermoplastic structure for visible and X-ray data recording. Photothermoplastic materials (PTPM) consist the chalcogenide glassy semiconductors and polymeric thermoplastic materials. Our researches were aimed to find out a possibility of using the PTPM as recording media for imaging including X-rays.

Citation Download Citation

Vasile K. Rotaru, Igor V. Ciapurin, and Oleg Korshack "Reliefographical structures based on doped chalcogenide semiconductors for optical data storage in wide spectral region including x-ray", Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); https://doi.org/10.1117/12.450785

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