Paper
21 December 2001 CVD diamond detectors for current mode neutron time-of-flight spectroscopy at OMEGA/NIF
Gregory J. Schmid, Vladimir Yu. Glebov, Allen V. Friensehner, Dana R. Hargrove, Steven P. Hatchett II, Nobuhiko Izumi, Richard A. Lerche, Thomas W. Phillips, Thomas Craig Sangster, Christopher T. Silbernagel, Christian Stoeckl
Author Affiliations +
Abstract
We have performed pulsed neutron and pulsed laser tests of a CVD diamond detector manufactured from DIAFILM, a commercial grade of CVD diamond. The laser tests were performed at the short pulse UV laser at Bechtel Nevada in Livermore, CA. The pulsed neutrons were provided by DT capsule implosions at the OMEGA laser fusion facility in Rochester, NY. From these tests, we have determined the impulse response to be 250 ps fwhm for an applied E-field of 500 V/mm. Additionally, we have determined the sensitivity to be 2.4 mA/W at 500 V/mm and 4.0 mA/W at 100 V/mm. These values are approximately 2 to 5x times higher than those reported for natural Type IIa diamond at similar E-field and thickness (1mm). These characteristics allow us to conceive of a neutron time-of-flight current mode spectrometer based on CVD diamond. Such an instrument would sit inside the laser fusion target chamber close to target chamber center (TCC), and would record neutron spectra fast enough such that backscattered neutrons and (gamma) rays from the target chamber wall would not be a concern. The acquired neutron spectra could then be used to extract DD fuel areal density from the downscattered secondary to secondary ratio.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory J. Schmid, Vladimir Yu. Glebov, Allen V. Friensehner, Dana R. Hargrove, Steven P. Hatchett II, Nobuhiko Izumi, Richard A. Lerche, Thomas W. Phillips, Thomas Craig Sangster, Christopher T. Silbernagel, and Christian Stoeckl "CVD diamond detectors for current mode neutron time-of-flight spectroscopy at OMEGA/NIF", Proc. SPIE 4510, Charged Particle Detection, Diagnostics, and Imaging, (21 December 2001); https://doi.org/10.1117/12.451260
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Cited by 7 scholarly publications.
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KEYWORDS
Diamond

Sensors

Chemical vapor deposition

Laser welding

Pulsed laser operation

Semiconducting wafers

Spectroscopy

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