Improved 3D boundary charge method for high-accuracy calculation of potential and electric field in composite dielectric system

Hidekazu Murata; Toshimi Ohye; Hiroshi Shimoyama

doi:10.1117/12.451271

21 December 2001 Improved 3D boundary charge method for high-accuracy calculation of potential and electric field in composite dielectric system

Hidekazu Murata, Toshimi Ohye, Hiroshi Shimoyama

Author Affiliations +

Proceedings Volume 4510, Charged Particle Detection, Diagnostics, and Imaging; (2001) https://doi.org/10.1117/12.451271
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

In this paper we propose an improved three-dimensional (3D) boundary charge method (BCM) for a composite dielectric system in which insulators, i.e., dielectric materials exist together with conducting electrodes. The method is based on the idea that the composite dielectric system can equivalently be replaced with a conductor system in vacuum by introducing an apparent surface charge density (=true surface charge density + polarization surface charge density), on every conductor-to-dielectric interface and every dielectric-to-dielectric interface. In calculating the apparent surface charge density, whole interfaces are divided into n small surface elements, and the apparent surface (or boundary) charge density on each small surface element is obtained by solving a set of n-dimensional simultaneous linear equations, where the coefficient matrix elements is expressed as a double integral and the diagonal matrix element becomes a singular or nearly singular integral. A high-accuracy and high-speed calculation of the double integral is the key point of the method, and we have succeeded in great improvement of both numerical accuracy and computation time.

Citation Download Citation

Hidekazu Murata, Toshimi Ohye, and Hiroshi Shimoyama "Improved 3D boundary charge method for high-accuracy calculation of potential and electric field in composite dielectric system", Proc. SPIE 4510, Charged Particle Detection, Diagnostics, and Imaging, (21 December 2001); https://doi.org/10.1117/12.451271

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