Paper
18 September 2001 Selection and attributes of objective function of electro-optical system vulnerbility to ECM(EOSVECM)
Juquan Zhang, Yiyu Zhou, Wei An, Weili Jiang, Qi-zhong Lu, Hongxu Huang
Author Affiliations +
Proceedings Volume 4556, Data Mining and Applications; (2001) https://doi.org/10.1117/12.440297
Event: Multispectral Image Processing and Pattern Recognition, 2001, Wuhan, China
Abstract
Under the direction of the principle of EOSVECM, a new semi- quantitative index--the turning point of the dominance of utilizing electromagnetic spectrum--is put forward in this article as the first objective function of EOSVECM, and 18 attributes (connotation) of this kind of objective function is analyzed, so as to inaugurate the concrete approach to this kind index of EOSVECM.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juquan Zhang, Yiyu Zhou, Wei An, Weili Jiang, Qi-zhong Lu, and Hongxu Huang "Selection and attributes of objective function of electro-optical system vulnerbility to ECM(EOSVECM)", Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); https://doi.org/10.1117/12.440297
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KEYWORDS
Electro optical systems

Electro optics

Computer simulations

Picosecond phenomena

Data modeling

Electro optical modeling

Electromagnetism

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