Paper
11 February 2002 Grayscale template-matching using finite-state machines
Author Affiliations +
Proceedings Volume 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II; (2002) https://doi.org/10.1117/12.455247
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States
Abstract
This paper develops and extends the SKIPSM (Separated-Kernel Image Processing using finite-State Machines) paradigm to provide fast and efficient grey-scale template matching on ordinary desktop computers. An earlier paper, published in 1994, applied the SKIPSM theory to a limited version of grey-scale template matching, but the specific applications used LUTs (lookup tables) and pipelined hardware, as with all SKIPSM papers of that era. In this paper, direct software implementations of the finite-state machines are used, rather than LUTs, because computers with pipelined instruction streams and vector data structures lose most of their speed advantages when using LUTs.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederick M. Waltz and John W. V. Miller "Grayscale template-matching using finite-state machines", Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); https://doi.org/10.1117/12.455247
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KEYWORDS
Computing systems

Tolerancing

Binary data

Image processing

Image quality

Logic

Mathematics

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