Paper
22 May 2002 Influence of intraband relaxation processes on threshold and power-current characteristics of semiconductor lasers
Georgy G. Zegrya, Natalya A. Gunko, Eugen B. Dogonkin
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Abstract
The effect of carrier-carrier relaxation and carrier - phonon relaxation on threshold characteristics of quantum well (QW) lasers is studied. Carrier relaxation time considerably depends on temperature, carrier density, and quantum well width. It is shown that in this case the gain coefficient becomes a more pronounced function of temperature and carrier density.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georgy G. Zegrya, Natalya A. Gunko, and Eugen B. Dogonkin "Influence of intraband relaxation processes on threshold and power-current characteristics of semiconductor lasers", Proc. SPIE 4651, Novel In-Plane Semiconductor Lasers, (22 May 2002); https://doi.org/10.1117/12.467955
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KEYWORDS
Quantum wells

Laser damage threshold

Semiconductor lasers

Electrons

Scattering

Solids

Indium arsenide

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