Paper
3 June 2002 Holographic microscopy in space and time
Guy J. M. Indebetouw
Author Affiliations +
Proceedings Volume 4659, Practical Holography XVI and Holographic Materials VIII; (2002) https://doi.org/10.1117/12.469284
Event: Electronic Imaging, 2002, San Jose, California, United States
Abstract
Two schemes for digital holographic microscopy are explored. The goal is to revisit the issues that have hindered holographic microscopy since its earlier days, and find ways to overcome these difficulties. The first scheme discussed is a full-field holographic method that takes advantages of the properties of charge-coupled-device detectors, namely their high spatial as well as temporal bandwidths. The second scheme is based ona scanning holographic technique, and is shown to offer a wide range of possibilities such as enhanced transverse resolution, extended depth of focus, or axial sectioning. Both schemes are described, and some of their attributes and relative merits are discussed.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guy J. M. Indebetouw "Holographic microscopy in space and time", Proc. SPIE 4659, Practical Holography XVI and Holographic Materials VIII, (3 June 2002); https://doi.org/10.1117/12.469284
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KEYWORDS
Holography

Holograms

Sensors

Objectives

Microscopy

Digital holography

Heterodyning

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