Paper
8 March 2002 Repeated-measure validation of craniofacial metrics from three-dimensional surface scans: application to medical genetics
Eric A. Lauer, Brian D. Corner, Peng Li, Robert M. Beecher, Curtis Deutsch
Author Affiliations +
Proceedings Volume 4661, Three-Dimensional Image Capture and Applications V; (2002) https://doi.org/10.1117/12.460171
Event: Electronic Imaging, 2002, San Jose, California, United States
Abstract
Traditionally, medical geneticists have employed visual inspection (anthroposcopy) to clinically evaluate dysmorphology. In the last 20 years, there has been an increasing trend towards quantitative assessment to render diagnosis of anomalies more objective and reliable. These methods have focused on direct anthropometry, using a combination of classical physical anthropology tools and new instruments tailor-made to describe craniofacial morphometry. These methods are painstaking and require that the patient remain still for extended periods of time. Most recently, semiautomated techniques (e.g., structured light scanning) have been developed to capture the geometry of the face in a matter of seconds. In this paper, we establish that direct anthropometry and structured light scanning yield reliable measurements, with remarkably high levels of inter-rater and intra-rater reliability, as well as validity (contrasting the two methods).
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric A. Lauer, Brian D. Corner, Peng Li, Robert M. Beecher, and Curtis Deutsch "Repeated-measure validation of craniofacial metrics from three-dimensional surface scans: application to medical genetics", Proc. SPIE 4661, Three-Dimensional Image Capture and Applications V, (8 March 2002); https://doi.org/10.1117/12.460171
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reliability

Ear

3D metrology

Scanners

3D scanning

Structured light

Head

RELATED CONTENT

Comparison of Cyberware PX and PS 3D human head scanners
Proceedings of SPIE (February 25 2008)
Anthropometry for HMD design
Proceedings of SPIE (October 30 1992)
Review of 20 years of range sensor development
Proceedings of SPIE (January 10 2003)

Back to Top