Paper
12 March 2002 Fast simulation of atomic-force-microscope imaging of atomic and polygonal surfaces using graphics hardware
Gokul Varadhan, Warren Robinett, Dorothy Erie, Russell M. Taylor II
Author Affiliations +
Proceedings Volume 4665, Visualization and Data Analysis 2002; (2002) https://doi.org/10.1117/12.458778
Event: Electronic Imaging, 2002, San Jose, California, United States
Abstract
We present a fast method for computing simulated Atomic Force Microscope (AFM) image scans (including tip artifacts). The basic insight is that the array of depth values in the depth buffer of a graphics system is analogous to the height field making up an AFM image, and thus the ability of graphics hardware to compute the depth of many pixels in parallel can be used to radically speed up the AFM imaging simulation. We also present a method for reconstructing better approximations to the true shape from AFM images distorted by tip artifacts. These algorithms are implemented using operations from 3D grayscale mathematical morphology operations of dilation and erosion.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gokul Varadhan, Warren Robinett, Dorothy Erie, and Russell M. Taylor II "Fast simulation of atomic-force-microscope imaging of atomic and polygonal surfaces using graphics hardware", Proc. SPIE 4665, Visualization and Data Analysis 2002, (12 March 2002); https://doi.org/10.1117/12.458778
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Cited by 10 scholarly publications.
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KEYWORDS
Visualization

Computer simulations

Atomic force microscopy

Imaging systems

Atomic force microscope

Computer programming

Computer programming languages

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