Detection of sample parameters in secondary electron microscope images: test results

Sowmya Mahadevan; David P. Casasent

doi:10.1117/12.470107

7 June 2002 Detection of sample parameters in secondary electron microscope images: test results

Sowmya Mahadevan, David P. Casasent

Proceedings Volume 4735, Hybrid Image and Signal Processing VIII; (2002) https://doi.org/10.1117/12.470107
Event: AeroSense 2002, 2002, Orlando, FL, United States

Abstract

Secondary electron microscope images (SEIs) are analyzed in an automatic system to provide material properties for fracture analyses etc. The image processing presently used is summarized and initial results presented. Our new grain boundary (GB) detection and line following algorithms are presented. Line following locates triple junctions (TJs) (points where 3 grains meet). Initial versions of advanced algorithms to calculate TJ angles, reduce false GBs and TJs and select a reduced number of good probe points are advanced using a new noise map. Registration and formation of mosaic images are also addressed. Results on about 2000 sector images in 5 slices are presented.

Citation Download Citation

Sowmya Mahadevan and David P. Casasent "Detection of sample parameters in secondary electron microscope images: test results", Proc. SPIE 4735, Hybrid Image and Signal Processing VIII, (7 June 2002); https://doi.org/10.1117/12.470107

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available