Testing system of photo detector of PIN photodiode

Rongguo Fu; Benkang Chang; Yunsheng Qian; Yuan Zhi Zong; Qi Hai Zhan

doi:10.1117/12.451767

25 October 2002 Testing system of photo detector of PIN photodiode

Rongguo Fu, Benkang Chang, Yunsheng Qian, Yuan Zhi Zong, Qi Hai Zhan

Proceedings Volume 4772, Electro-Optical System Design, Simulation, Testing, and Training; (2002) https://doi.org/10.1117/12.451767
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

The paper designs a set of system for measuring the responding characteristic of detector of PIN photon diode. The paper introduces the principle and structure of the PIN diode detector, and then describes the researching background and the responding characteristic of the detector. The detailed designing plan is given, and the step of implement is brought out. The system is composed of three subsystems. The first is optical system. The optical system can produce a laser of 1.06μm with a certain frequency and energy, with the aid of light source and CCD camera, the laser beam can focus on the surface of the photon detector of PIN diode. The second is signal-testing system. It can measure the responding characteristic of the photon detector, and the average noise power. The third is temperature control system. The responding characteristic of the photon detector in the high temperature and low temperature can be obtained with the temperature-control device. All the data is recorded and analyzed by the computer. At last, the paper provides the structure of the system and the testing result of the photon detector.

Citation Download Citation

Rongguo Fu, Benkang Chang, Yunsheng Qian, Yuan Zhi Zong, and Qi Hai Zhan "Testing system of photo detector of PIN photodiode", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.451767

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