Extended-cavity semiconductor lasers in fundamental metrology

Josef Lazar; Ondrej Cip; Petr Jedlicka; B. Ruzicka

doi:10.1117/12.484546

29 July 2002 Extended-cavity semiconductor lasers in fundamental metrology

Josef Lazar, Ondrej Cip, Petr Jedlicka, B. Ruzicka

Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484546
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

We present the design of several types of extended-cavity lasers (ECL) based on the Littman1 configuration and an arrangement for an external stabilizating scheme employing Doppler-free saturation spectroscopy in the molecular iodine. The ECLs followed the requirements of metrological applications where the stress has been put to mechanical stability, thermal control, narrow linewidth and a mode-hop free tuning range. We developed the technique of antireflection coatings of the laser diodes front facets which proved to be a crucial step towards the internal cavity suppression and propper operation of the ECL. To control the laser optical frequency an electronics consisting of a precise thermal control and a current source with a protective circuitry was designed.

Citation Download Citation

Josef Lazar, Ondrej Cip, Petr Jedlicka, and B. Ruzicka "Extended-cavity semiconductor lasers in fundamental metrology", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484546

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