Possibility of remote sensing of surface roughness with a projector microscope based on a copper vapor optical quantum generator

Vladimir Ya. Mendeleev; Vyatcheslav T. Karpukhin; Ivan I. Klimovskii; Michael M. Malikov; Sergey N. Skovorod'ko; A. V. Kourilovich

doi:10.1117/12.484460

29 July 2002 Possibility of remote sensing of surface roughness with a projector microscope based on a copper vapor optical quantum generator

Vladimir Ya. Mendeleev, Vyatcheslav T. Karpukhin, Ivan I. Klimovskii, Michael M. Malikov, Sergey N. Skovorod'ko, A. V. Kourilovich

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Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484460
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

Rough surfaces were illuminated by yellow (?=O.5782 ?m) and green (?=O.5106 ?m) light of a copper vapor optical quantum generator, and the light scattered from the surfaces passed through a projector microscope. The microscope included a laser tube of the quantum generator and a Glan prism placed inside an unstable resonator of the quantum generator. Slightly and very rough steel surfaces with small rms slopes of roughness were studied. The original ratio between intensities of the illuminating yellow and green light was transformed by both the rough surface and the projector microscope. Rough surfaces amplified the ratio of intensities of the scattered yellow to green light and the amplification factor depended on the statistics of rough surfaces. The ratio of intensities of the yellow to green light at the output of the projector microscope increased with increasing intensity at the input of the microscope. For the relative intensity greater than 0.4, the projector microscope amplified this ratio and the ratio was attenuated by the microscope for smaller relative intensity. Two methods for measuring surface roughness are proposed.

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Vladimir Ya. Mendeleev, Vyatcheslav T. Karpukhin, Ivan I. Klimovskii, Michael M. Malikov, Sergey N. Skovorod'ko, and A. V. Kourilovich "Possibility of remote sensing of surface roughness with a projector microscope based on a copper vapor optical quantum generator", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484460

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KEYWORDS

Microscopes

Projection systems

Light scattering

Surface roughness

Quantum optics

Copper

Prisms

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