Paper
18 October 2002 Optical tomography using confocal fan-beam illumination and its application to LCD panel inspection
Akira Ishii, Makoto Shimizu, Yoshitaka Imoto
Author Affiliations +
Proceedings Volume 4902, Optomechatronic Systems III; (2002) https://doi.org/10.1117/12.467626
Event: Optomechatronic Systems III, 2002, Stuttgart, Germany
Abstract
This paper describes optical tomography using oblique and confocal fan-beam illumination devised for transparent-layered objects. This 3-D imaging method has the advantage of area-at-a-time sensing and it is free from disturbances caused by defects on the object surface, compared with the conventional confocal microscopy based on point-by-point sensing and co-axial illumination. The method was applied to LCD panel inspection and was successful in efficiently detecting foreign substances between the constituent layers in LCD. Furthermore, it was robust against scratches and dust on the protection film surface of the LCD.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Akira Ishii, Makoto Shimizu, and Yoshitaka Imoto "Optical tomography using confocal fan-beam illumination and its application to LCD panel inspection", Proc. SPIE 4902, Optomechatronic Systems III, (18 October 2002); https://doi.org/10.1117/12.467626
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KEYWORDS
LCDs

Inspection

Confocal microscopy

Glasses

Optical tomography

Particles

CCD image sensors

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