Paper
5 September 2002 54-deg. high-reflection phase retarder at 1315 nm
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Abstract
In this paper, the periodic all dielectric multilayers of high reflection phase retarders are designed. And the software of Tfcalc has been used to optimized for the design that produces a 900phase shift between the p- and s- polarization components at the incidence angle of 540 and at the wavelength of 1315 nm while maintaining high reflectivity (>99.90%) for both components. A tolerance analysis indicates that the coating layers must be deposited within ±14% to achieve a 90± iO° phase shift error.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying-Jian Wang, Zhaosheng Tang, and Zhengxiu Fan "54-deg. high-reflection phase retarder at 1315 nm", Proc. SPIE 4914, High-Power Lasers and Applications II, (5 September 2002); https://doi.org/10.1117/12.481771
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KEYWORDS
Phase shifts

Reflection

Glasses

Dielectric polarization

Coating

Refractive index

Sensors

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