Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface

Semyon Papernov; Ansgar W. Schmid

doi:10.1117/12.480065

30 May 2003 Damage behavior of SiO₂ thin films containing gold nanoparticles lodged at predetermined distances from the film surface

Semyon Papernov, Ansgar W. Schmid

Author Affiliations +

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.480065
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

The impact of absorbing defect location inside thin film on measured laser-damage threshold and morphology is explored, using gold nanoparticles as artificial thin-film defects. In this work, 351-nm, 0.5-ns laser pulses were used to produce damage in SiO₂ thin film containing gold nanoparticles located at predetermined but different distances from the film surface. As a result, laser-induced damage thresholds detected by means of dark-field optical microscopy and atomic force microscopy are measured and comparative trends are analyzed. Damage-crater geometry variations with particle-lodging depth are also obtained and compared with theoretical predictions.

Citation Download Citation

Semyon Papernov and Ansgar W. Schmid "Damage behavior of SiO₂ thin films containing gold nanoparticles lodged at predetermined distances from the film surface", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.480065

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