Numerical simulations of laser/defect-induced absorption in SiO2

Florian Bonneau; Patrick Combis; A. Pujols; Jean-Luc Rullier; M. Seques; Jacques Vierne

doi:10.1117/12.472408

30 May 2003 Numerical simulations of laser/defect-induced absorption in SiO₂

Florian Bonneau, Patrick Combis, A. Pujols, Jean-Luc Rullier, M. Seques, Jacques Vierne

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472408
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

We have performed simulations of laser energy deposit in sub-micrometric spherical defects and the surrounding fused silica. We have studied crater generation produced by the absorber explosion with a 2D/3D Lagrange-Euler code taking into account crack formation and propagation in the brittle material. The comparison of the 2D simulations with experiment shows quite good agreement for shallow defects (depth < 2 μm). We have observed experimentally that the explosion of deeper absorbers results in a more complex crater morphology. Therefore we have begun performing 3D simulations in order to reproduce these features. Depending on the defect depth, the cracks may not reach the surface and a crater doesn't appear. Nevertheless, those cracks or pre-existing cracks can contribute to efficient electric field enhancement and breakdown on the surface. Different types of cracks (size, inclination, filled with a material or not) were investigated and the 2D or 3D electromagnetic field distributions were computed using a finite element code.

Citation Download Citation

Florian Bonneau, Patrick Combis, A. Pujols, Jean-Luc Rullier, M. Seques, and Jacques Vierne "Numerical simulations of laser/defect-induced absorption in SiO₂", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472408

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