Paper
9 July 2003 Real-time optically sectioned wide-field microscopy employing structured light illumination and a CMOS detector
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Abstract
Real-time optically sectioned microscopy is demonstrated using an AC-sensitive detection concept realized with smart CMOS image sensor and structured light illumination by a continuously moving periodic pattern. We describe two different detection systems based on CMOS image sensors for the detection and on-chip processing of the sectioned images in real time. A region-of-interest is sampled at high frame rate. The demodulated signal delivered by the detector corresponds to the depth discriminated image of the sample. The measured FWHM of the axial response depends on the spatial frequency of the projected grid illumination and is in the μm-range. The effect of using broadband incoherent illumination is discussed. The performance of these systems is demonstrated by imaging technical as well as biological samples.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jelena Mitic, Tiemo Anhut, Alexandre Serov, Theo Lasser, and Stephane Bourquin "Real-time optically sectioned wide-field microscopy employing structured light illumination and a CMOS detector", Proc. SPIE 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X, (9 July 2003); https://doi.org/10.1117/12.478024
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Cited by 2 scholarly publications.
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KEYWORDS
CMOS sensors

Microscopy

Digital signal processing

Structured light

Signal processing

Spatial frequencies

Imaging systems

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