Reliability of 1.3-um VCSELs for metro area networks

Simon R. Prakash; Leo M. F. Chirovsky; Ryan L. Naone; David Galt; Dave W. Kisker; Andrew W. Jackson

doi:10.1117/12.482853

17 June 2003 Reliability of 1.3 micron VCSELs for metro area networks

Simon R. Prakash, Leo M. F. Chirovsky, Ryan L. Naone, David Galt, Dave W. Kisker, Andrew W. Jackson

Proceedings Volume 4994, Vertical-Cavity Surface-Emitting Lasers VII; (2003) https://doi.org/10.1117/12.482853
Event: Integrated Optoelectronics Devices, 2003, San Jose, CA, United States

Abstract

Vertical Cavity Surface Emitting Lasers (VCSELs) have been widely adopted in the 850nm data communications markets with great success. Using this technology as a basis, we have developed a 1.3 μm InGaAsN VCSEL and VCSEL Array technology for telecommunications applications. Since the reliability requirement of this market is less than 150 FITs over 20 years, we focused a great deal of development time on the reliability of the device, and so far have been able to predict an MTTF of over 13 million hours or 71 FITs. This report provides a brief summary of the characteristics of the VCSEL in various stress conditions and the methodology used to measure both the wear-out and random failure rates of the devices.

Citation Download Citation

Simon R. Prakash, Leo M. F. Chirovsky, Ryan L. Naone, David Galt, Dave W. Kisker, and Andrew W. Jackson "Reliability of 1.3 micron VCSELs for metro area networks", Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); https://doi.org/10.1117/12.482853

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