Paper
9 April 2003 Optical and thermal properties of a novel metallized azo dye as a short-wavelength optical recording medium
Bin Wei, Yiqun Wu, Donghong Gu, Fuxi Gan
Author Affiliations +
Proceedings Volume 5060, Sixth International Symposium on Optical Storage (ISOS 2002); (2003) https://doi.org/10.1117/12.510081
Event: Sixth International Symposium on Optical Storage (ISOS 2002), 2002, Wuhan, China
Abstract
Metallized azo dyes are paid much attention as recording media of digital versatile disc-recordable (DVD-R) due to their excellent optical and thermal properties within short wavelength (630 to approximately 650 nm). In this paper, a novel metallized azo dye has been synthesized. Smooth films on optical glass and single-crystal silicon were prepared by spin-coating method. The UV-Vis absorption spectra of the dye were measured in solution and in film. The optical constants (complex refractive index N=n+\ik) of the film on single-crystal silicon have been determined using scanning ellipsometer. The variation of the complex refractive index N with wavelength λ was obtained. Thermo-gravimetric analysis (TGA) of the dye showed clear threshold of thermal decomposition. Static optical recording tests were carried out to evaluate the performance of the optical recording medium. The results show that the dye is a promising candidate as a recording medium of DVD-R.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Wei, Yiqun Wu, Donghong Gu, and Fuxi Gan "Optical and thermal properties of a novel metallized azo dye as a short-wavelength optical recording medium", Proc. SPIE 5060, Sixth International Symposium on Optical Storage (ISOS 2002), (9 April 2003); https://doi.org/10.1117/12.510081
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Absorption

Optical recording

Reflectivity

Thermography

Refractive index

Silicon films

Optical testing

Back to Top