Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR

R. Cristescu; Gabriel Socol; Ion N. Mihailescu; Ion G. Morjan; Iulia Soare; Mihai A. Popescu; F. Sava; C. O. Morosanu; I. Stamatin; A. Andrei; Johny Neamtu

doi:10.1117/12.537509

14 November 2003 Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR

R. Cristescu, Gabriel Socol, Ion N. Mihailescu, Ion G. Morjan, Iulia Soare, Mihai A. Popescu, F. Sava, C. O. Morosanu, I. Stamatin, A. Andrei, Johny Neamtu

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Proceedings Volume 5147, ALT'02 International Conference on Advanced Laser Technologies; (2003) https://doi.org/10.1117/12.537509
Event: ALT'02 International Conference on Advanced laser Technologies, 2002, Adelboden, Switzerland

Abstract

We report the obtaining of thin organic films based on poly(methyl methacrylate) polymer by Pulsed Laser Deposition on silicon substrates and quartz slides. The films were characterized by complementary techniques: x-ray Diffraction, x-ray Photoelectron Spectroscopy, Atomic Force Microscopy, Optical Microscopy, Raman Spectroscopy and Fourier Transform Infrared Spectroscopy. The obtained structures are amorphous. The film composition and structure depend on both the laser fluence as well as on the temperature of the substrate during deposition. We put in evidence in freshly deposited films the presence of diamond-like carbon while its amount strongly increases by annealing at ~400°C in Argon atmosphere.

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R. Cristescu, Gabriel Socol, Ion N. Mihailescu, Ion G. Morjan, Iulia Soare, Mihai A. Popescu, F. Sava, C. O. Morosanu, I. Stamatin, A. Andrei, and Johny Neamtu "Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR", Proc. SPIE 5147, ALT'02 International Conference on Advanced Laser Technologies, (14 November 2003); https://doi.org/10.1117/12.537509

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