Advances in polarization metrology

Russell A. Chipman

doi:10.1117/12.511279

6 November 2003 Advances in polarization metrology

Russell A. Chipman

Proceedings Volume 5174, Novel Optical Systems Design and Optimization VI; (2003) https://doi.org/10.1117/12.511279
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.

Citation Download Citation

Russell A. Chipman "Advances in polarization metrology", Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); https://doi.org/10.1117/12.511279

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