Paper
20 November 2003 Contact model of the probe in form measurement
Author Affiliations +
Abstract
Form Measurements used to lie somewhere between the macroscopic CMM and the microscopic surface measurement. But there are some specific details that should be treated differently. And one of these is the effect of the probe on the measurement. In the new standards, this appears already as a morphological filter. But there are still some aspects that may be considered also, for instance, the possibility of deformation the contact between the probe and workpiece. In this work, we developed a mathematical model (experimentally proven) to evaluate this effect during a form measurement in a reference laboratory, while performign the usual measurement procedures for roundness, cylindricity, straightness evaluation, among others. It could be considered either in the uncertainty budget or the measurement itself. This model may be extrapolated to other fields, although it was restricted to form measurements at the beginning, where the conditions differ, for example, on the number of points measured, filters and algorithms, etc. Its implementation in other more sophisticated algorithms developed, will not complicate the theoretical model, but may be helpful when comparing the results obtained from different reference laboratories.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria A. Saenz-Nuno "Contact model of the probe in form measurement", Proc. SPIE 5190, Recent Developments in Traceable Dimensional Measurements II, (20 November 2003); https://doi.org/10.1117/12.507499
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Tungsten

Chemical species

Algorithm development

Linear filtering

Ruby

Image filtering

Nanolithography

RELATED CONTENT

Four-dimensional ATR processing and visualization
Proceedings of SPIE (May 05 2000)
Terrain description and obstacle detection from range image
Proceedings of SPIE (September 23 1994)
Global gray-level deformation removal in images
Proceedings of SPIE (November 21 2003)
Clustered-dot halftoning with direct binary search
Proceedings of SPIE (January 18 2010)

Back to Top