Development of birefringence measurement with double rotating polarization components

Norihiro Umeda; Satoshi Tanaka; Atsuo Takayanagi; Yukitoshi Otani; Hiroyuki Kohwa

doi:10.1117/12.507258

14 November 2003 Development of birefringence measurement with double rotating polarization components

Norihiro Umeda, Satoshi Tanaka, Atsuo Takayanagi, Yukitoshi Otani, Hiroyuki Kohwa

Proceedings Volume 5192, Optical Diagnostic Methods for Inorganic Materials III; (2003) https://doi.org/10.1117/12.507258
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

A novel birefringence measurement with double rotating polarization elements is proposed. This system includes rotating components of linear polarizer and quarter-wave plate with different rotating speeds. The birefringence is calculated by analyzing the Fourier components for rotation frequency in a detected signal. In this paper, the basic principle and experimental results of the birefringence measurement are described.

Citation Download Citation

Norihiro Umeda, Satoshi Tanaka, Atsuo Takayanagi, Yukitoshi Otani, and Hiroyuki Kohwa "Development of birefringence measurement with double rotating polarization components", Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); https://doi.org/10.1117/12.507258

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