Paper
23 December 2003 Spatially resolved tilt and strain measurements in diamond crystals
Szczesny B. Krasnicki, Yuncheng Zhong, Jozef Maj, Albert T. Macrander
Author Affiliations +
Abstract
X-ray diffraction imaging with micrometer resolution was performed on type Ib and IIa diamond crystals. Experiments were carried out using 8 keV x-rays and a double-crystal diffractometer equipped with a CCD detector (pixel size 60 μm x 60 μm). Diamond samples were rotated about the horizontal axis collinear with a given reciprocal lattice vector. Local rocking curves (LRCs) were extracted from sequences of topographs taken at various angles along the global rocking curves measured at different azimuth positions of the specimen. Based on the angular positions of these LRCs, maps of local tilt and strain were produced. Results demonstrate that local misorientations play a more important role than do lattice parameter variations in broadening of total crystal rocking curves.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Szczesny B. Krasnicki, Yuncheng Zhong, Jozef Maj, and Albert T. Macrander "Spatially resolved tilt and strain measurements in diamond crystals", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); https://doi.org/10.1117/12.516621
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diamond

Crystals

Etching

Sensors

Charge-coupled devices

CCD image sensors

X-ray diffraction

RELATED CONTENT

Bragg diffraction of a focused x ray beam as a...
Proceedings of SPIE (September 03 2008)
Developments in CCD-based beta/x-ray imaging
Proceedings of SPIE (December 19 2001)
X ray CCD camera to detect scattered light in the...
Proceedings of SPIE (June 15 1995)
Development Of A High Resolution X Ray Imaging Device For...
Proceedings of SPIE (January 01 1987)
Modular CCD detector for x-ray crystallography
Proceedings of SPIE (July 12 1993)

Back to Top