Advances in CCD technology for x-ray diffraction applications

Timothy A. Thorson; Roger D. Durst; Dan Frankel; Rex L. Bordwell; Jose R. Camara; Edward Leon-Guerrero; Steven K. Onishi; Francis Pang; Paul Vu; Edwin M Westbrook

doi:10.1117/12.505710

20 January 2004 Advances in CCD detector technology for x-ray diffraction applications

Timothy A. Thorson, Roger D. Durst, Dan Frankel, Rex L. Bordwell, Jose R. Camara, Edward Leon-Guerrero, Steven K. Onishi, Francis Pang, Paul Vu, Edwin M Westbrook

Author Affiliations +

Proceedings Volume 5198, Hard X-Ray and Gamma-Ray Detector Physics V; (2004) https://doi.org/10.1117/12.505710
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Phosphor-coupled CCDs are established as one of the most successful technologies for x-ray diffraction. This application demands that the CCD simultaneously achieve both the highest possible sensitivity and high readout speeds. Recently, wafer-scale, back illuminated devices have become available which offer significantly higher quantum efficiency than conventional devices (the Fairchild Imaging CCD 486 BI). However, since back thinning significantly changes the electrical properties of the CCD the high speed operation of wafer-scale, back-illuminated devices is not well understood. Here we describe the operating characteristics (including noise, linearity, full well capacity and CTE) of the back-illuminated CCD 486 at readout speeds up to 4 MHz.

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Timothy A. Thorson, Roger D. Durst, Dan Frankel, Rex L. Bordwell, Jose R. Camara, Edward Leon-Guerrero, Steven K. Onishi, Francis Pang, Paul Vu, and Edwin M Westbrook "Advances in CCD detector technology for x-ray diffraction applications", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); https://doi.org/10.1117/12.505710

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