Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching

Gomez W Wright; Giuseppe S. Camarda; Edson Kakuno; Longxia Li; Fengying Lu; Chun Lee; Arnold Burger; Jack I. Trombka; D. Peter Siddons; Ralph B. James

doi:10.1117/12.510180

20 January 2004 Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching

Gomez W Wright, Giuseppe S. Camarda, Edson Kakuno, Longxia Li, Fengying Lu, Chun Lee, Arnold Burger, Jack I. Trombka, D. Peter Siddons, Ralph B. James

Author Affiliations +

Proceedings Volume 5198, Hard X-Ray and Gamma-Ray Detector Physics V; (2004) https://doi.org/10.1117/12.510180
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd_0.9Zn_0.1Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.

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Gomez W Wright, Giuseppe S. Camarda, Edson Kakuno, Longxia Li, Fengying Lu, Chun Lee, Arnold Burger, Jack I. Trombka, D. Peter Siddons, and Ralph B. James "Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); https://doi.org/10.1117/12.510180

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