Reliability of oxide VCSELs at Emcore

Christopher J. Helms; Ian Aeby; Wenlin Luo; Robert W Herrick; Albert Yuen

doi:10.1117/12.539282

16 June 2004 Reliability of oxide VCSELs at Emcore

Christopher J. Helms, Ian Aeby, Wenlin Luo, Robert W Herrick, Albert Yuen

Proceedings Volume 5364, Vertical-Cavity Surface-Emitting Lasers VIII; (2004) https://doi.org/10.1117/12.539282
Event: Integrated Optoelectronic Devices 2004, 2004, San Jose, CA, United States

Abstract

Recent data on 10 Gb/s oxide VCSELs are presented. We cover failure analysis results on VCSELs that failed in the field, including failures due to electrostatic discharge (ESD) and those inherent to the limitations of the present mesa structure used in oxide VCSELs. An ongoing experiment to overcome these limitations is discussed.

Citation Download Citation

Christopher J. Helms, Ian Aeby, Wenlin Luo, Robert W Herrick, and Albert Yuen "Reliability of oxide VCSELs at Emcore", Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); https://doi.org/10.1117/12.539282

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