Test methods and technology for uncooled imaging systems

Scott J. Miller; Brian S. Backer; Margaret Kohin; Pascual Alonso; Jason T. Whitwam

doi:10.1117/12.542269

5 August 2004 Test methods and technology for uncooled imaging systems

Scott J. Miller, Brian S. Backer, Margaret Kohin, Pascual Alonso, Jason T. Whitwam

Proceedings Volume 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV; (2004) https://doi.org/10.1117/12.542269
Event: Defense and Security, 2004, Orlando, Florida, United States

Abstract

BAE SYSTEMS produces hundreds of low cost, high performance, uncooled IR imagers each month for use in commercial and military applications. The production process of each imager includes several steps that begin at the wafer level and end at an in-camera test. Each step is critical to end yield improvement by detecting failure at various stages in the production flow. Both automated test equipment and an integrated database system are essential at each phase to efficiently build and automatically configure cameras for each customer. This paper discusses the process and tools used to reliably test and ship uncooled thermal imagers in addition to specific methods and calculation techniques for characterizing key performance parameters such as Responsivity, Noise Equivalent Temperature Difference, and Operability.

Citation Download Citation

Scott J. Miller, Brian S. Backer, Margaret Kohin, Pascual Alonso, and Jason T. Whitwam "Test methods and technology for uncooled imaging systems", Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); https://doi.org/10.1117/12.542269

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